Synopsys has announced its latest automatic test pattern generation and diagnostics package. Called TetraMAX II, the software is said to incorporate test engines announced in October 2015. Supporting ...

This paper is presented with the Video Graphics Array (VGA) and Digital Visual Interface - Digital (DVI-D) test pattern generator solution with display monitor timing specification as per the Video ...

Through A Series Of Enhancements, This Tool Suite Raises The Performance Of Test-Pattern Generation And At-Speed Testing. To design complex ASICs in a timely and cost-effective manner, engineers must ...

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

BALTIMORE--At the International Test Conference here today, Synopsys Inc. announced new advanced test modeling technology that will more than triple the capacity of the company's design-for-test ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

SAN JOSE, Calif. &#151 Mentor Graphics Corp. has added new automated functionality to its FastScan automatic test pattern generation tool (ATPG) and its TestKompress embedded deterministic test tool.

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

The ability to create and choose the most effective test patterns has become more daunting as more patterns are introduced, says Ron Press of Siemens Digital Industries. Choosing the most efficient ...