The Joint Test Action Group (JTAG) was formed in mid 1980s to develop a method of verifying designs and testing printed circuit boards after manufacture. Prior to the development of JTAG, testing and ...

With each turn of Moore's Law, designers at every phase in the development process are challenged with new levels of complexity. Chip designers must not only get the integrated circuit (IC) logic, ...

A practical guide to the best Web3 debugging tools in 2025, covering smart contract testing, transaction analysis, and on-chain debugging across EVM and non EVM chains.

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

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Teledyne LeCroy, part of Teledyne Technologies Incorporated , today announces support for DisplayPorttm 2.1 physical layer (PHY) compliance testing in its second-generation QualiPHY 2 automated ...