Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

Researchers from Northwestern University, University of Virginia, Carnegie Mellon University, and Argonne National Laboratory have made a significant advancement in defect detection and process ...

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

Domestic researchers have developed a module that can be combined with existing factory production equipment to implement artificial intelligence (AI). When the module is attached, it can autonomously ...

Nerve agents are highly toxic chemical warfare agents that inhibit acetylcholinesterase (AChE) in the nervous system, causing severe symptoms like seizures and respiratory failure. Timely detection of ...