AZOM

Accelerating Multi-Modal Materials Characterization with Plasma FIB-SEM

In this interview, AZoM speaks to Dr. Dean Miller, Senior Scientist at TESCAN Group, about how plasma FIB-SEM can be used to accelerate multi-modal materials characterization. FIB-SEM is based on a ...
AZoNano

ZEISS Crossbeam: FIB-SEM for High Throughput 3D Analysis and Sample Preparation

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AZOM

Plasma FIB-SEM platform for deep sectioning - TESCAN SOLARIS X

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AZoNano

Nanofluidic Devices for DNA Optical Mapping can be Fabricated and Characterized with FIB-SEM

Utilizing FIB-SEM, nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were characterized and fabricated. Direct FIB nanopatterning of silicon master stamps enables the quick ...
Financial Post

JEOL: Launch of the FIB-SEM System "JIB-PS500i" with High Precision and High Resolution

TOKYO — JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces its launch of the FIB-SEM system “JIB-PS500i” on February 1, 2023. With the finer structure of advanced materials and advancing ...