A comprehensive scanning electron microscopy (SEM) analysis necessitates high-quality specimen preparation. Traditional mechanical sample preparation techniques, such as grinding, polishing, ...

Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...

In this interview, Pedro Machado shares expertise on electron microscopy, detailing sample preparation methods and the critical role of multimodal imaging in biological studies. Multimodal biological ...