The circuit has been constructed to provide an in-circuit system that will test the integrity of electronic components such as Silicon Controlled Rectifiers, diodes, and PNP or NPN transistors. 4093 – ...
We have all had difficulty testing diodes in-circuit. Most DMM’s have a diode Vf function that measures forward drop, but what is the normal voltage drop? Analog VOM’s attempt to measure resistance of ...
This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
Abstract: This paper reports on the development of the electrical test setup for microfluidic field effect transistor (FET). Testing of the device commences during the fabrication process where ...
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