PALO ALTO, Calif.–Agilent Technologies Inc. today rolled out a desktop version of its flash-memory and logic tester line. The Versatest Model V4000 is a complete, single platform that is geared for ...

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...

Over time many of us accumulate a stock of components, including logic IC's (TTL and CMOS). If you're anything like me, many of these will be secondhand - salvaged from old projects and PCBs. The ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.