Abstract: The Algorithmic Pattern Generator (ALPG) is widely adopted to address massive test vector volumes in memory testing. However, the test rate is limited by the complex arithmetic operations ...
Abstract: As the prevalence of faulty chips increases post-deployment, effective in-field testing is imperative. This paper introduces a novel approach for generating software-based self-test (SBST) ...
Foundation model-powered dual-module system establishes a new performance benchmark for AI-driven peptide drug discovery SAN FRANCISCO , CA, UNITED STATES, April 15 ...
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